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   Surface Morphology Laboratory

Nanostep insturment for surface profiling
Stomic force microscope
micro-profiler for surface finish measurement
  • Wyko profilometer
  • Rank-Taylor Hobson nanostep profilometer
    • Ultimate vertical resolution of 31 picometers
    • Maximum trace length of 50mm
  • Scanning probe microscope system
    • Atomic force microscope
    • Scanning tunneling microscope
  Point of Contact: Thomas J. Kester (205)544-9204